Magnetic near field probe based on the high-frequency carrier type thin-film magnetic field sensor

Summary form only given. Rapid growth of information technology (IT) markets has raised a need of magnetic near field measurements on densely packaged PCBs and LSIs for the detection of the source current of electromagnetic emission and the evaluation of electronic signal integrity. This paper proposes a new application of the high frequency carrier type magnetic field sensor (or so-called GMI sensor) to a miniature magnetic near field probe with high sensitivity in just a 100 /spl mu/m size.