By Topic

Magnetic near field probe based on the high-frequency carrier type thin-film magnetic field sensor

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Yamaguchi, M. ; Res. Inst. of Electr. Commun., Tohoku Univ., Sendai, Japan ; Kikuchi, H. ; Sugimoto, S. ; Arai, K.-I.
more authors

Summary form only given. Rapid growth of information technology (IT) markets has raised a need of magnetic near field measurements on densely packaged PCBs and LSIs for the detection of the source current of electromagnetic emission and the evaluation of electronic signal integrity. This paper proposes a new application of the high frequency carrier type magnetic field sensor (or so-called GMI sensor) to a miniature magnetic near field probe with high sensitivity in just a 100 /spl mu/m size.

Published in:

Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International

Date of Conference:

April 28 2002-May 2 2002