By Topic

Scalar BPM analyses of TE and TM polarized fields in bent waveguides

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Song, W.J. ; Dept. of Mechatronics, KwangJu Inst. of Sci. & Technol., South Korea ; Byung Ha Ahn

We have applied the effective index method to reduce the two-dimensional refractive index profile into the one-dimensional refractive index structure and modified the wave equations to obtain paraxial wave equations. TE and TM polarized fields in the curved single-mode planar waveguides are analyzed using the scalar beam-propagation method employing the finite-difference method with a slab structure. The bending loss in bent waveguides is analyzed for optical fields obtained from the beam-propagation method and comparisons are made between the loss for the waveguides with various radii of curvature and refractive index differences. The outward shift of the optical field, which is generated at the connection between a straight and bent waveguide, is obtained from calculations of the location of maximum optical intensity. The transition loss can be reduced by introducing an optimized inward offset at a straight-to-bend junction. The wavelength shift due to birefringence of TE and TM polarized fields in bent waveguides is also calculated.

Published in:

Information Technology: Coding and Computing, 2002. Proceedings. International Conference on

Date of Conference:

8-10 April 2002