Cart (Loading....) | Create Account
Close category search window
 

Testing of asynchronous designs by "inappropriate" means. Synchronous approach

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Kondratyev, A. ; Cadence Berkeley Lab., CA, USA ; Sorensen, L. ; Streich, A.

The roadblock to wide acceptance of asynchronous methodology is poor CAD support. Current asynchronous design tools require a significant re-education of designers, and their capabilities are far behind synchronous commercial tools. This paper considers the testing methodology for a particular subclass of asynchronous circuits (Null Convention Logic or NCL) that entirely relies on conventional CAD tools available at today's market. It is shown that for acyclic NCL pipelines a test pattern generation for stuck-at faults could be effectively solved through the construction and checking of the synchronous circuit with a set of faults "equivalent" to the original NCL circuit. This result is extended to arbitrary NCL structures by applying the partial scan technique to break computational loops. The method guarantees 100% stuck-at fault coverage in NCL systems, which is confirmed by experimental data.

Published in:

Asynchronous Circuits and Systems, 2002. Proceedings. Eighth International Symposium on

Date of Conference:

8-11 April 2002

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.