Cart (Loading....) | Create Account
Close category search window
 

Orthogonal distance fitting of implicit curves and surfaces

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Sung Joon Ahn ; Dept. of Inf. Process., Fraunhofer Inst. for Manuf. Eng. & Autom., Stuttgart, Germany ; Rauh, W. ; Hyung Suck Cho ; Warnecke, H.-J.

Dimensional model fitting finds its applications in various fields of science and engineering and is a relevant subject in computer/machine vision and coordinate metrology. In this paper, we present two new fitting algorithms, distance-based and coordinate-based algorithm, for implicit surfaces and plane curves, which minimize the square sum of the orthogonal error distances between the model feature and the given data points. Each of the two algorithms has its own advantages and is to be purposefully applied to a specific fitting task, considering the implementation and memory space cost, and possibilities of observation weighting. By the new algorithms, the model feature parameters are grouped and simultaneously estimated in terms of form, position, and rotation parameters. The form parameters determine the shape of the model feature and the position/rotation parameters describe the rigid body motion of the model feature. The proposed algorithms are applicable to any kind of implicit surface and plane curve. In this paper, we also describe algorithm implementation and show various examples of orthogonal distance fit

Published in:

Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:24 ,  Issue: 5 )

Date of Publication:

May 2002

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.