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Testing of a microanalysis system

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1 Author(s)
Kerkhoff, H.G. ; MESA Res. Inst., Twente Univ., Enschede, Netherlands

During the testing of microsystems, one has to cope with many problems resulting from inaccessibility, different technologies, and nonelectrical failure modes. A number of mixed-signal test techniques have been applied to test a new advanced microsystem. The choices on testing are directly dependent on implementation form and application area of the microsystem. Mixed-signal testing approaches are a key factor in this environment

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Instrumentation and Measurement, IEEE Transactions on  (Volume:50 ,  Issue: 6 )