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Reducing the cost of scan in deep sub-micron designs

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2 Author(s)
Rahimi, K. ; Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA ; Soma, M.

Proposes a method for reducing the cost of scan by assigning scan elements to multiple scan chains after placements are determined. An algorithm based on Gale-Shapley stable marriage is proposed. Experiments with ISCAS89 benchmarks show that the algorithm reduces scan chain lengths by 55 to 92 percent

Published in:

ASIC/SOC Conference, 2001. Proceedings. 14th Annual IEEE International

Date of Conference:

2001

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