By Topic

Scanning carrier current method for in-situ measurement of flying height variation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Zhi-Min Yuan ; Data Storage Inst., Singapore ; Bo Liu ; Sheng-Bin Hu ; Qing-Fang Leng
more authors

A novel writing process based in-situ flying height measurement method, scanning carrier current method, is proposed. An erasure current oscillating in the frequency range of 200~800 kHz is injected to the write head during the period of interest. Later, its effect on previously written data is detected to infer the flying height during the period of interest. The maximum scanning carrier current method provides a good solution to measure flying height variation in a large range during dynamic transient process. When the slider is in steady flying status, a lower scanning carrier current method can reduce the noise caused by media's MrT fluctuation, whilst a biased scanning carrier current method is suitable to reduce the noise caused by media's coercivity fluctuation in the flying height testing process

Published in:

IEEE Transactions on Magnetics  (Volume:37 ,  Issue: 4 )