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Improvement of magnetic and R/W properties in longitudinal media by using CrX/Cr dual underlayer

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7 Author(s)
D. D. Djayaprawira ; Dept. of Electron. Eng., Tohoku Univ., Sendai, Japan ; A. Horii ; K. Komiyama ; S. Yoshimura
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The effect of in-plane lattice matching on the magnetic and read/write properties has been quantitatively studied in CoCr24 Pt12B4 or CoCr20Pt8Ta 4 media grown on Cr, CrMo20 and CrMo20/Cr underlayer. It is found that by using CrMo20 (5 nm)/Cr (5 nm) dual underlayer, significant improvement of magnetic and R/W properties are realized. It is clarified that: (1) the utilization of CrMo/Cr dual underlayer increases Hc mainly due to the improvement of in-plane crystallographic orientation; (2) the lattice misfit has a small effect on the improvement of in-plane crystallographic orientation. The improvement of in-plane crystallographic orientation by using CrX/Cr dual underlayer is suggested to be due to lattice strain at the interface of Cr and CrX underlayer, which enhances the grain growth of the magnetic layer

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IEEE Transactions on Magnetics  (Volume:37 ,  Issue: 4 )