By Topic

Functional correlation analysis in crosstalk induced critical paths identification

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Xiao, T. ; Sun Microsyst. Inc., Palo Alto, CA, USA ; Marek-Sadowska, M.

In deep submicron digital circuits capacitive couplings make delay of a switching signal highly dependent on its neighbors' switching times and switching directions. A long path may have a large number of coupling neighbors with difficult to determine interdependencies. Ignoring the mutual relationship among the signals may result in a very pessimistic estimation of circuit delay. In this paper, we apply efficient functional correlation analysis techniques to identify critical paths caused by crosstalk delay effects. We also discuss applications to static timing optimization. Experiments demonstrate efficacy of the proposed technique.

Published in:

Design Automation Conference, 2001. Proceedings

Date of Conference:

22-22 June 2001