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We propose a visual inspection method of defect detection on textile surfaces; selectively removing the textural information from textile surfaces. For this purpose we use wavelet shrinkage, which was originally proposed by Donoho and Johnstone as a method to remove Gaussian white noise (1994, 1995). We also propose a modification of wavelet shrinkage to selectively remove textural information as noise. Once the textural information, is removed from textile surfaces, the remaining inspection processes can be conducted in the image domain. In this way, we can utilize the image processing methods and techniques developed so far for the visual inspection of other industrial products.