Cart (Loading....) | Create Account
Close category search window

Observation of domain expansion and contraction in TbFe films by Lorentz microscopy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Lin, C.J. ; IBM Almaden Res. Center, San Jose, CA, USA ; Rugar, D.

Lorentz electron microscopy techniques have been used to study in situ, at room temperature, the expansion and contraction of thermomagnetically written circular domains in Tb19Fe81 and Tb32Fe68 films. Domains expand or contract more or less radially in Tb19Fe81, but with the development of jagged walls. In Tb32Fe68, dendritelike stripe domains with jagged walls form either outside or within the existing domains, leaving the perimeter of the initial circular domains unchanged. The difference in behavior can be understood in terms of the difference in the importance of the local demagnetizing field relative to the local total field. The implications of the nonuniform wall motion for the appearance of domain irregularity during thermomagnetic recording are discussed

Published in:

Magnetics, IEEE Transactions on  (Volume:24 ,  Issue: 6 )

Date of Publication:

Nov 1988

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.