IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Conference Publications > Advanced Semiconductor Device ... Help

On a control of photon-surface plasmon coupling at a multilayer diffraction grating

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Dmitruk, N.L. ; Inst. of Semicond. Phys., Acad. of Sci., Kiev, Ukraine ; Mayeva, O.I. ; Mamykin, S.V. ; Yastrubchak, O.B.

This article is devoted to investigation of multilayer diffraction grating using spectroscopic ellipsometry. The present study demonstrates the capability of techniques used as a tool to obtain information about the possibilities to control of photon-surface plasmon coupling at a multilayer diffraction gratings and usefulness especially for optochemical sensors and photodetectors application

Published in:
Advanced Semiconductor Devices and Microsystems, 2000. ASDAM 2000. The Third International EuroConference on

Date of Conference: 2000

Page(s):
445 - 448
Meeting Date :
16 Oct 2000-18 Oct 2000
Print ISBN:
0-7803-5939-9
INSPEC Accession Number:
6893480
Conference Location :
Smolenice
Digital Object Identifier :
10.1109/ASDAM.2000.889541
Product Type:
Conference Publications

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.