Cart (Loading....) | Create Account
Close category search window
 

Multifrequency emission of wheat: Modeling and applications

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Ferrazzoli, P. ; Dipt. di Inf. Sistemi e Produzione, Univ. Tor Vergata, Rome, Italy ; Wigneron, J.-P. ; Guerriero, L. ; Chanzy, A.

The microwave brightness temperatures of a wheat field were measured in 1993, during the whole growth cycle by the six-frequency PORTOS radiometer, at two polarizations and several angles. In this paper, the emissivities measured at L-, C-, X-, and K-band are compared with those simulated by a discrete multiple scattering model based on the radiative transfer theory. The agreement between experimental and simulated data is generally good at all frequencies, although a unique set of input parameters has been used. It is demonstrated that the model simulations lead to a reliable identification of the radiometric configurations most sensitive to ground variables. Moreover, they aid the development of a soil moisture inversion algorithm that performs well even with soils covered by developed vegetation.

Published in:

Geoscience and Remote Sensing, IEEE Transactions on  (Volume:38 ,  Issue: 6 )

Date of Publication:

Nov 2000

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.