Cart (Loading....) | Create Account
Close category search window
 

White on black: a white-box-oriented approach for selecting black box-generated test cases

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Chen, T.Y. ; Sch. of Inf. Technol., Swinburne Univ. of Technol., Australia ; Poon, P.-L. ; Tang, S.F. ; Yu, Y.T.

Many useful test case construction methods that are based on important aspects of the specification have been proposed in the literature. A comprehensive test suite thus obtained is often very large and yet is non-redundant with respect to the aspects identified from the specification. This paper addresses the problem of selecting a subset of test cases from such a test suite. We propose the use of white box criteria to select test cases from the initial black-box-generated test suite. We illustrate our ideas with examples and demonstrate the viability and benefits of our approach by means of a case study

Published in:

Quality Software, 2000. Proceedings. First Asia-Pacific Conference on

Date of Conference:

2000

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.