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Tutorial: synchronous dynamic memory test construction-a field approach

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1 Author(s)
J. Vollrath ; White Oak Semicond., Sandston, VA, USA

This paper gives an introduction how to construct dynamic memory tests and test flows. Step by step a basic march test is developed choosing a pattern, voltage levels and timings. Starting with this basic pattern, modifications for characterization, diagnostic and speed testing are discussed. These variations are then used to construct a test sequence to ensure functionality according to the data sheet specification

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Memory Technology, Design and Testing, 2000. Records of the 2000 IEEE International Workshop on

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