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Digital-compatible BIST for analog circuits using transient response sampling

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2 Author(s)
P. N. Variyam ; Mkixed-Signal Wireless Group, Texas Instrum. Inc., Dallas, TX, USA ; A. Chatterjee

For complex mixed-signal designs, BIST is becoming a necessity. The BIST scheme presented here maximizes coverage of parametric and catastrophic failures and provides an all-digital BIST solution to analog circuits

Published in:

IEEE Design & Test of Computers  (Volume:17 ,  Issue: 3 )