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Extraction of peak-to-peak and RMS sinusoidal jitter using an analytic signal method

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5 Author(s)
T. J. Yamaguchi ; Advantest Labs. Ltd., Sendai, Japan ; M. Soma ; M. Ishida ; T. Watanabe
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This paper proposes a new method based on analytic signal theory for extracting both instantaneous and RMS sinusoidal jitter from PLL output signals. The method relies on the extension of a real signal into an analytic signal by utilizing the Hilbert transform. Both the theoretical basis and fundamental concepts of the proposed method are explained. A review of conventional testing methods is also presented. Results of Matlab simulations validate the performance of the proposed method for measuring random jitter. The method is further validated by comparing experimental sinusoidal jitter results with those measured with a time interval analyzer

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VLSI Test Symposium, 2000. Proceedings. 18th IEEE

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