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Meta analysis of classification algorithms for pattern recognition

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1 Author(s)
So Young Sohn ; Dept. of Comput. Sci. & Ind. Syst. Eng., Yonsei Univ., Seoul, South Korea

Various classification algorithms became available due to a surge of interdisciplinary research interests in the areas of data mining and knowledge discovery. We develop a statistical meta-model which compares the classification performances of several algorithms in terms of data characteristics. This empirical model is expected to aid decision making processes of finding the best classification tool in the sense of providing the minimum classification error among alternatives

Published in:

Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:21 ,  Issue: 11 )

Date of Publication:

Nov 1999

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