Cart (Loading....) | Create Account
Close category search window
 

Photovoltaic system testing techniques and results

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Lashway, C. ; New Mexico Solar Energy Inst., Las Cruces, NM, USA

Over the past three years, the New Mexico Solar Energy Institute (NMSEI) has tested and collected data on eight intermediate-size flat-plate photovoltaic systems. These data are now included in a valuable database for determining component reliability and system degradation trends. The specific test techniques used by NMSEI and the reliability of photovoltaic modules revealed by this testing are described and discussed. These methods are: I-V curve plotting, operating voltage and current measurements, and shading tests. These use of I-V curve data are important in determining array peak power rating and quickly locating large system faults. Operating voltage and current measurements are used in determining the location of module level faults. Bypass diode current measurements in conjunction with intentional module shading are used for isolating module faults in intermediate-size systems and systems with inaccessible module wiring. Of the 64000 modules tested, 362 modules (0.6%) were not contributing power

Published in:

Energy Conversion, IEEE Transactions on  (Volume:3 ,  Issue: 3 )

Date of Publication:

Sep 1988

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.