By Topic

Quantitative roughness characterization of geological surfaces and implications for radar signature analysis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
W. Dierking ; Danish Center for Remote Sensing, Tech. Univ. Denmark, Lyngby, Denmark

Stochastic surface models are useful for analyzing in situ roughness profiles and synthetic aperture radar (SAR) images of geological terrain. In this paper, two different surface models are discussed: surfaces with a stationary random roughness (conventional model) and surfaces with a power-law roughness spectrum (fractal model). In the former case, it must be considered that for short profiles (L<200l0), the measured values of rms-height s and correlation length l may be significantly smaller than the intrinsic values s0 and l0. In the latter case, rms-height and correlation length depend on the profile length L, and the surface is better characterized by slope and offset of the roughness spectrum (which are independent of L), The sensitivity of the SAR signature to variations in surface roughness parameters is evaluated by means of theoretical scattering models. For smoother geological surfaces such as most arid terrain types, single scattering is dominant, which means that the roughness parameters can be determined from SAR data using comparatively simple algorithms. Multiple scattering processes on rough surfaces such as a'a lava and variations of the local incidence angle due to large-scale terrain undulations make the retrieval of roughness parameters by means of inverse modeling much more complex. Field data of surface roughness indicate that rougher geological surfaces may be in the diffractal regime at higher radar frequencies, in which the scattering characteristics deviate significantly from the patterns observed for stationary surfaces. On the basis of surface and scattering models, recently published observations of roughness data and radar signatures from volcanic, alluvial, and arid surfaces are examined

Published in:

IEEE Transactions on Geoscience and Remote Sensing  (Volume:37 ,  Issue: 5 )