Close category search window
 

Optimal synthesis of smart measurement systems with adaptive correction of drifts and setting errors of the sensor's working point

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Platonov, A.A. ; Inst. of Electron. Syst., Warsaw Univ. of Technol., Poland ; Szabatin, J. ; Jedrzejewski, K.

This paper deals with a problem in optimal synthesis of smart measurement systems. A nonlinear model of the sensor is introduced, and directly applied to the derivation of optimal algorithms for processing measurement data. The analysis is performed for systems with both noncompensatory and compensatory sensors. It is assumed that a measurement is performed in the presence of random disturbances and noise. The algorithms developed take into account the limited input-output range of the sensor as well as the influence of its internal noise on measurement quality. Simultaneously, they automatically and optimally correct errors in the initial setting of the sensor's working point, as well as those caused by its random drift

Published in:
Instrumentation and Measurement, IEEE Transactions on  (Volume:47 ,  Issue: 3 )

Date of Publication: Jun 1998

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.