Cart (Loading....) | Create Account
Close category search window
 

High-reliability, low-energy microarchitecture synthesis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Dasgupta, A. ; Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA ; Karri, R.

Continuous scaling of device dimensions has accelerated the power dissipation and electromigration-induced reliability degradation in integrated circuits. Submicrometer scaling increases the fraction of on-chip energy dissipated on long interconnects and buses. In addition, submicrometer-level scaling increases current density in long interconnects and buses, causing structural damage in metal lines due to electromigration (a major failure phenomenon in integrated circuits). We present algorithms for synthesizing high-reliability, low-energy microarchitectures. This can be realized by judiciously binding and scheduling the data transfers of a control-data-flow graph representation of an application onto the buses in the microarchitecture. The algorithm considers (i) correlations between data transfers, (ii) constraints on the number of buses, and (iii) area and delay

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:17 ,  Issue: 12 )

Date of Publication:

Dec 1998

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.