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Possibilities and limitations of IDDQ testing in submicron CMOS

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2 Author(s)
Joan Figueras ; Electronic Engineering Department, Polytechnic University of Catalonia, Barcelona 08028, Spain ; Antoni Ferré

IDDQ Testing is a well accepted testing approach based on the observation of the quiescent current consumption. Its growing industrial implementation is based on the possibility of detecting defects which escape other more traditional testing methods. However, its application costs are higher and its effectiveness in deep submicron technologies may decrease if the current trend of leakage increase is not stopped by creative innovation.

Published in:

IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part B  (Volume:21 ,  Issue: 4 )