Cart (Loading....) | Create Account
Close category search window
 

Open-ended coaxial-line permittivity measurements on pulverized materials

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Nelson, S.O. ; US Dept. of Agric., Athens, GA, USA ; Bartley, P.G.

The open-ended, coaxial-line probe technique can be used to obtain estimates of the permittivities of some solid dielectrics over broad ranges of frequency by measurements on powdered or pulverized samples, but certain limitations must be recognized. Such a probe was used with a network analyzer to estimate the permittivities of coal and limestone from reflection coefficients measured on pulverized samples. The bulk density of the pulverized samples for the coaxial probe measurements was determined from auxiliary, single-frequency permittivity measurements on the samples at known bulk densities, and the permittivities of the solid materials over the frequency range from 0.2 GHz to 20 GHz were then estimated by computations based on the Landau and Lifshitz, Looyenga dielectric mixture equation and solid material densities

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:47 ,  Issue: 1 )

Date of Publication:

Feb 1998

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.