Cart (Loading....) | Create Account
Close category search window
 

Spectrum folding and phase noise in LC tuned oscillators

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Samori, C. ; Dipt. di Elettronica e Inf., Politecnico di Milano, Italy ; Lacaita, A.L. ; Villa, F. ; Zappa, F.

We present a theory of the noise transfer in LC tuned oscillators accounting for the nonlinear operation of the transconductor. We show that the transconductor switching causes a folding of the wide-band noise such as the thermal noise of the spreading resistance of the bipolar transistors and the noise of the tail current generator. The effect is similar to what happens in sampled systems, however, for a careful evaluation of the oscillator phase noise, the correlations between the folded terms is of chief importance. We show how to account for the effect, we assess the impact on the oscillator noise performance and we give the guidelines for the circuit optimization

Published in:

Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on  (Volume:45 ,  Issue: 7 )
RFIC Virtual Journal, IEEE

Date of Publication:

Jul 1998

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.