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Accuracy of lumped-element calibrations for four-sampler vector network analyzers

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3 Author(s)
R. B. Marks ; Nat. Inst. of Stand. & Technol., Boulder, CO, USA ; J. A. Jargon ; D. K. Rytting

Several lumped-element calibrations have been proposed for four-sampler vector network analyzers. This paper offers the first assessment of their accuracy in the face of imperfectly defined standards. We discover significant error and introduce a new calibration that offers demonstrably improved accuracy.

Published in:

Microwave Symposium Digest, 1998 IEEE MTT-S International  (Volume:3 )

Date of Conference:

7-12 June 1998