By Topic

High reliability of GaInP/GaInAs 980-nm window laser

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
N. Ikoma ; Optoelectron. R&D Labs., Sumitomo Electr. Ind. Ltd., Yokohama, Japan ; J. Hashimoto ; M. Murata ; T. Katsuyama
more authors

Summary form only given. We fabricated a GaInP-GaInAs 980-nm window laser using selective nitrogen ion implantation and subsequent anneal process. The results of the aging test of the lasers indicate very high reliability of 600000 h median life under 150-mW operation at 250C.

Published in:

Lasers and Electro-Optics, 1998. CLEO 98. Technical Digest. Summaries of papers presented at the Conference on

Date of Conference:

3-8 May 1998