By Topic

An unbiased detector of curvilinear structures

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Steger, C. ; Tech. Univ. Munchen, Germany

The extraction of curvilinear structures is an important low-level operation in computer vision that has many applications. Most existing operators use a simple model for the line that is to be extracted, i.e., they do not take into account the surroundings of a line. This leads to the undesired consequence that the line will be extracted in the wrong position whenever a line with different lateral contrast is extracted. In contrast, the algorithm proposed in this paper uses an explicit model for lines and their surroundings. By analyzing the scale-space behavior of a model line profile, it is shown how the bias that is induced by asymmetrical lines can be removed. Furthermore, the algorithm not only returns the precise subpixel line position, but also the width of the line for each line point, also with subpixel accuracy

Published in:

Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:20 ,  Issue: 2 )