Referenced Items are not available for this document.
Earlier approaches dealt with the detection of catastrophic faults based on IDD monitoring. Consideration of the more subtle parametric faults and the ADC quantization noise, however, is essential for high-quality analog testing. The paper presents a new design method for analog test of parametric and catastrophic faults by IDD monitoring. ADC quantization noise is systematically considered throughout the method. Results prove its effectiveness
Published in:
Design, Automation and Test in Europe, 1998., Proceedings
Date of Conference: 23-26 Feb 1998
- Page(s):
- 822 - 827
- Meeting Date :
- 23 Feb 1998-26 Feb 1998
- Print ISBN:
- 0-8186-8359-7
- INSPEC Accession Number:
- 5906892
- Conference Location :
- Paris
- Digital Object Identifier :
- 10.1109/DATE.1998.655953
- Product Type:
- Conference Publications
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