Cart (Loading....) | Create Account
Close category search window
 

A 2-dimensional Kerr-effect technique for electric field distribution in liquid dielectrics

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Zhu, Y. ; Electron. Meas. Lab., Musashi Inst. of Technol., Tokyo, Japan ; Takada, Tatsuo

Based on the electro-optical Kerr effect, an attempt is made to develop a measurement technique for the two-dimensional distribution of the electrical field in dielectric liquids. For rapid, two-dimensional measurements, it is convenient to introduce a computer-controlled electronic camera for optical detection. However, because of the two-dimensional non-uniformity resulting from the system components, the measurement principle needs a two-dimensional analysis. To simplify the mathematical analysis, square pulsed modulations are employed. The influence of the system non-uniformity is eliminated by use of both optical and electrical modulations. To improve the system sensitivity, an optimum system setup is analyzed. To decrease the effect of the noise component resulting from the EHD (electrohydrodynamic) motion of the dielectric liquid, a diagnostic image lock-in technique is proposed. The validity of the two-dimensional measurement principle and the effectiveness of the diagnostic image lock-in processing are examined by the measurement of the electrical field distribution in a nitrobenzene specimen between two parallel plate electrodes

Published in:

Dielectrics and Electrical Insulation, IEEE Transactions on  (Volume:4 ,  Issue: 6 )

Date of Publication:

Dec 1997

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.