Cart (Loading....) | Create Account
Close category search window
 

Toward a theory of test data selection

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Goodenough, J.B. ; SofTech, Inc., Waltham, MA, USA ; Gerhart, S.L.

Examines the theoretical and practical role of testing in software development. The authors prove a fundamental theorem showing that properly structured tests are capable of demonstrating the absence of errors in a program. The theorem's proof hinges on our definition of test reliability and validity, but its practical utility hinges on being able to show when a test is actually reliable. The authors explain what makes tests unreliable (for example, they show by example why testing all program statements, predicates, or paths is not usually sufficient to insure test reliability), and they outline a possible approach to developing reliable tests. They also show how the analysis required to define reliable tests can help in checking a program's design and specifications as well as in preventing and detecting implementation errors.

Published in:

Software Engineering, IEEE Transactions on  (Volume:SE-1 ,  Issue: 2 )

Date of Publication:

June 1975

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.