Cart (Loading....) | Create Account
Close category search window
 

Low cost arrangements for scale model RCS and pattern measurements

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Eskelinen, Pekka ; Lappeenranta Univ. of Technol., Finland ; Harju, P.

Cost-effective RCS and radiation pattern measurements are possible with scale models of original targets using frequencies up to 20 GHz when construction efforts are focused at relevant details and requirements of increased conductivity are not exaggerated. Aluminium foil and copper tape work well as coating surface whereas many foam based plastics are readily usable as transparent structures. Most pattern measurements can be performed at one sixth of the far field limit with less than 1 dB error and even RCS tests give reasonable views on critical locations of the design within similar distances. Here uncertainties below 3 dB are readily achievable though fringing patterns require heavy mathematical post-processing. A suitable combination of target scale reduction, generally below 1:20, often enables the use of both modest X to Ku band frequencies, medium sized rotators for targets lighter than 10 kg and indoor test ranges with path distances under 10 meters

Published in:

Aerospace and Electronics Conference, 1997. NAECON 1997., Proceedings of the IEEE 1997 National  (Volume:2 )

Date of Conference:

14-18 Jul 1997

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.