By Topic

Discriminative learning of relaxed hierarchy for large-scale visual recognition

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Tianshi Gao ; Dept. of Electrical Engineering, Stanford University, USA ; Daphne Koller

In the real visual world, the number of categories a classifier needs to discriminate is on the order of hundreds or thousands. For example, the SUN dataset [24] contains 899 scene categories and ImageNet [6] has 15,589 synsets. Designing a multiclass classifier that is both accurate and fast at test time is an extremely important problem in both machine learning and computer vision communities. To achieve a good trade-off between accuracy and speed, we adopt the relaxed hierarchy structure from [15], where a set of binary classifiers are organized in a tree or DAG (directed acyclic graph) structure. At each node, classes are colored into positive and negative groups which are separated by a binary classifier while a subset of confusing classes is ignored. We color the classes and learn the induced binary classifier simultaneously using a unified and principled max-margin optimization. We provide an analysis on generalization error to justify our design. Our method has been tested on both Caltech-256 (object recognition) [9] and the SUN dataset (scene classification) [24], and shows significant improvement over existing methods.

Published in:

2011 International Conference on Computer Vision

Date of Conference:

6-13 Nov. 2011