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A wide and continuously tunable (30 nm) detector with uniform characteristics over tuning range

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3 Author(s)
Li, G.S. ; California Univ., Berkeley, CA, USA ; Yuen, W. ; Chang-Hasnain, C.J.

A wide and continuously tunable detector with 30 nm tuning range and uniform characteristics over the tuning range is demonstrated. This device is well suited for both single- and multi-mode wavelength division multiplexed (WDM) applications.

Published in:

Device Research Conference Digest, 1997. 5th

Date of Conference:

23-25 June 1997