By Topic

Performance testing effort at the ATM Forum: an overview

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
R. Jain ; Ohio State Univ., Columbus, OH, USA ; G. Babic

The Test Working Group of the ATM Forum is developing a specification for performance testing of ATM switches and networks. The emphasis is on the user-perceived frame-level performance. This article explains what is different about this new effort and describes its status

Published in:

IEEE Communications Magazine  (Volume:35 ,  Issue: 8 )