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Atomic force microscopy tip-sample interaction analysis using nanocontact mechanic models

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2 Author(s)
K. Daeinabi ; Department of Mechatronics Engineering, Science and Research Branch, Islamic Azad University, Tehran, Iran ; M. H. Korayem

Various nanocontact mechanic models have been proposed for modelling of the atomic force microscopy (AFM) cantilever tip and its interaction with the sample. In this Letter, the role of adhesion force on tip-sample contact radius and applied load are compared using different nanocontact mechanic models including Hertz, Derjaguin-Muller-Toporov, Johnson-Kendall-Roberts-Sperling, Burnham-Colton-Pollock, Carpick-Ogletree-Salmeron, Pietrement-Troyon, Sun and Maugis-Dugdale. According to dynamics modelling of the AFM cantilever tip and its interaction with the sample by nanocontact mechanic models, the variation of applied load and tip-sample contact radius by applying cantilever base position displacement is discussed. In addition, influence of the AFM probe geometry is investigated.

Published in:

IET Micro & Nano Letters  (Volume:6 ,  Issue: 9 )