Cart (Loading....) | Create Account
Close category search window
 

A new differential protection scheme for busbar considering CT saturation effect

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Chothani, N. ; Dept. of Electr. Eng., ADIT, Anand, India ; Bhalja, B.

The protection of busbar demands high integrity and high speed relaying scheme. This paper presents a new differential relaying scheme for the protection of busbar. The proposed scheme depends on the difference of the value of incoming and outgoing line currents of the respective phase at a particular bus. The proposed scheme has been tested extensively using the PSCAD/EMTDC software package with fault data generated, by modeling the existing 230 kV Indian power transmission systems. The proposed scheme provides stability against external faults, more sensitivity towards high resistance faults and better reliability in discriminating in-zone and out of zone faults. Moreover, the proposed scheme avoids the effect of early & severe CT saturation during heavy through faults.

Published in:

Electrical and Computer Engineering (CCECE), 2011 24th Canadian Conference on

Date of Conference:

8-11 May 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.