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Terahertz Near-Field Microscope: Analysis and Measurements of Scattering Signals

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5 Author(s)
Kiwon Moon ; Department of Electrical Engineering, POSTECH, Pohang, Korea ; Euna Jung ; Meehyun Lim ; Youngwoong Do
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We present the analysis and measurements of scattering signals of a terahertz pulse scattering-type near-field microscope. We used a self-consistent line dipole image method for the quantitative analysis of the THz near-field interaction. The line scan across a gold film demonstrated that the terahertz microscope has a nanoscale resolution of ~80 nm. The measurements of scattering signals on gold and silicon substrates were in good agreement with calculations.

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IEEE Transactions on Terahertz Science and Technology  (Volume:1 ,  Issue: 1 )