Referenced Items are not available for this document.
We present the analysis and measurements of scattering signals of a terahertz pulse scattering-type near-field microscope. We used a self-consistent line dipole image method for the quantitative analysis of the THz near-field interaction. The line scan across a gold film demonstrated that the terahertz microscope has a nanoscale resolution of ~80 nm. The measurements of scattering signals on gold and silicon substrates were in good agreement with calculations.
Published in:
Terahertz Science and Technology, IEEE Transactions on
(Volume:1
,
Issue:
1
)
Date of Publication: Sept. 2011
- Page(s):
- 164 - 168
- ISSN :
- 2156-342X
- INSPEC Accession Number:
- 12216082
- Digital Object Identifier :
- 10.1109/TTHZ.2011.2159876
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 29 August 2011
- Issue Date :
- Sept. 2011
- Sponsored by :
- IEEE Microwave Theory and Techniques Society
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