Close category search window
 

Agile Sensing Systems for Tomography

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
York, T. ; Sch. of Electr. & Electron. Eng., Univ. of Manchester, Manchester, UK ; McCann, H. ; Ozanyan, K.B.

The concept of Agile Tomography is introduced and exemplified by reviewing the progress in tomography sensors and systems which can be deployed in situ. Agile tomography capabilities are examined across a number of electromagnetic and electrical modalities, ranging from gamma-rays to low-frequency electrical measurements. The recent achievements in already established areas are highlighted, as well as emerging technology and new modalities.

Published in:
Sensors Journal, IEEE  (Volume:11 ,  Issue: 12 )

Date of Publication: Dec. 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.