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Browse Journals & Magazines > Electron Device Letters, IEEE ...> Volume:32 Issue:9 Help

Correlation of Human Metal Model and Transmission Line Pulsing Testing

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5 Author(s)
Malobabic, S. ; Dept. of EECS, Univ. of Central Florida, Orlando, FL, USA ; Salcedo, J.A. ; Righter, A.W. ; Hajjar, J.
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Passing voltage levels measured from the human metal model tester are correlated with the failure current levels obtained from the transmission line pulsing (TLP) tester for electrostatic discharge protection devices fabricated in 0.18- and 0.35-μm MOS technologies. Various relevant TLP parameters, including the holding voltage and on -state resistance, are accounted for in the improved correlation formula developed in this study.

Published in:
Electron Device Letters, IEEE  (Volume:32 ,  Issue: 9 )

Date of Publication: Sept. 2011

Page(s):
1200 - 1202
ISSN :
0741-3106
INSPEC Accession Number:
12213627
Digital Object Identifier :
10.1109/LED.2011.2160141
Product Type:
Journals & Magazines
Date of Publication :
18 August 2011
Date of Current Version :
22 August 2011
Issue Date :
Sept. 2011
Sponsored by :
IEEE Electron Devices Society

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