Close category search window
 

Inverse Profiling via an Effective Linearized Scattering Model and MRF Regularization

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Autieri, R. ; Dipt. per le Tecnol., Univ. degli Studi di Napoli Parthenope, Naples, Italy ; D'Urso, M. ; Isernia, T. ; Pascazio, V.

The aim of this letter is to show how a joint adoption of a suitable regularization scheme and a proper rewriting of the traditional electromagnetic scattering equation allows introducing an interesting linear inversion tool which allows achieving nice reconstructions in many cases of practical interest. In particular, an innovative inversion approach which takes definite advantage from the joint use of the Contrast Source-Extended Born model and a Markov-random-field-based regularization scheme is proposed. Numerical examples, confirming accuracy usefulness, are reported and discussed.

Published in:
Geoscience and Remote Sensing Letters, IEEE  (Volume:8 ,  Issue: 6 )

Date of Publication: Nov. 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.