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GPU-accelerated fault simulation and its new applications

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3 Author(s)
Huawei Li ; Key Lab. of Comput. Syst. & Archit., Chinese Acad. of Sci., Beijing, China ; Dawen Xu ; Kwang-Ting Cheng

GPUs have recently been explored as a new general-purpose computing platform, which are suitable for the acceleration of compute-intensive EDA applications. In this paper we describe a GPU-based one- to n-detection fault simulator for both stuck-at and transition faults, which demonstrates a 20X speedup over a commercial CPU-based fault simulator. We further show new fault-simulation-based test selection applications enabled by this accelerated fault simulation. Our results demonstrate that the tests selected from the applications achieve higher fault coverages for 1-to-n detections with steeper fault coverage curves, as well as a better delay test quality, in comparison with tests deterministically generated by commercial ATPG tools.

Published in:

VLSI Design, Automation and Test (VLSI-DAT), 2011 International Symposium on

Date of Conference:

25-28 April 2011