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DYTEST: a self-learning algorithm using dynamic testability measures to accelerate test generation

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2 Author(s)
Mao, W. ; Dept. of Electr. & Comput. Eng., Colorado Univ., Colorado Springs, CO, USA ; Ciletti, M.D.

A self-learning algorithm called DYTEST, which uses a dynamic testability measure (DTM) to accelerate test generation, is presented. DYTEST's DTM guides the choice of a potential main sensitizing path during test generation. A full-logic value label backward implication creates estimates of logic values for the primary inputs. Dependent and k-limited backtracks are used to further reduce the number of backtracks

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:9 ,  Issue: 8 )

Date of Publication:

Aug 1990

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