By Topic

Simulation of yield/cost learning curves with Y4

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Nag, P.K. ; Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA ; Maly, W. ; Jacobs, H.J.

This paper describes a prototype of a discrete event simulator-Y4 (yield forecaster)-capable of simulating defect related yield loss and manufacturing cost as a function of time, for a multiproduct IC manufacturing line. The methodology of estimating yield and cost is based on mimicking the operation and characteristics of a manufacturing line in the time domain. The paper presents a set of models that take into account the effect of particles introduced during wafer processing as well as changes in their densities due to process improvements. These models also illustrate a possible way of accounting for the primary attributes of fabrication, product, and failure analysis which affect yield learning. A spectrum of results are presented for a manufacturing scenario to demonstrate the usefulness of the simulator in formulating IC manufacturing strategies

Published in:

Semiconductor Manufacturing, IEEE Transactions on  (Volume:10 ,  Issue: 2 )