By Topic

Physical layer design and performance analysis on multi-Gbps millimeter-wave WLAN system

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Xin Zhang ; Wireless Communication Laboratory, National Institute of Information and Communications Technology, 20 Science Park Road, 01-09A/10 TeleTech Park ; Liru Lu ; Ryuhei Funada ; Chin-Sean Sum
more authors

60 GHz millimeter wave technology has become an attractive solution for wireless communication in the most recent market. In the draft of IEEE 802.11ad standard, two modulation schemes are being considered in the design of physical (PHY) layer, namely, Single-Carrier (SC), and Orthogonal Frequency Division Multiplexing (OFDM). In this paper, the error performances of both coded modulation schemes under different channel models with hardware impairment are investigated. This hardware impairment includes non-linear distortion induced by 60 GHz power amplifier (PA) and phase noise of 60 GHz Phased Locked Loop (PLL) circuit. The channel models include Line-of-Sight (LOS) and Non-Line-of-Sight (NLOS) conference room models. Simulation results demonstrate that OFDM requires a much higher back-off power than SC to achieve the system requirement. In a realistic 60GHz channel based on measurements provided by 802.11ad, OFDM has gained better performance than SC with hardware impairment under NLOS situation using directional antennae.

Published in:

Communication Systems (ICCS), 2010 IEEE International Conference on

Date of Conference:

17-19 Nov. 2010