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Multispectral Classification With Bias-Tunable Quantum Dots-in-a-Well Focal Plane Arrays

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6 Author(s)
Paskaleva, B.S. ; Dept. of Electr. & Comput. Eng., Univ. of New Mexico, Albuquerque, NM, USA ; Woo-Yong Jang ; Bender, S.C. ; Sharma, Y.D.
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Mid-wave and long-wave infrared (IR) quantum-dots-in-a-well (DWELL) focal plane arrays (FPAs) are promising technology for multispectral (MS) imaging and sensing. The DWELL structure design provides the detector with a unique property that allows the spectral response of the detector to be continuously, albeit coarsely, tuned with the applied bias. In this paper, a MS classification capability of the DWELL FPA is demonstrated. The approach is based upon: 1) imaging an object repeatedly using a sequence of bias voltages in the tuning range of the FPA and then 2) applying a classification algorithm to the totality of readouts, over multiple biases, at each pixel to identify the “class” of the material. The approach is validated for two classification problems: separation among different combinations of three IR filters and discrimination between rocks. This work is the first demonstration of the MS classification capability of the DWELL FPA.

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Sensors Journal, IEEE  (Volume:11 ,  Issue: 6 )