By Topic

An 18 b 12.5 MS/s ADC With 93 dB SNR

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)

This paper presents a precision 18-bit 12.5 MS/s ADC that was designed primarily for digital X-ray imaging systems. This ADC was intended to have a faster output data rate than the precision successive approximation ADCs normally chosen for these systems but with similar DC accuracy and dynamic range. The chosen architecture consists of a pipeline of two multi-bit successive approximation converters. The first successive approximation ADC generates an initial coarse conversion result. The DACs within this converter are then used to generate a residue which is amplified by a residue amplifier before being converted by a second successive approximation ADC. Four comparators within each ADC allow 2 bits to be determined each bit trial. Capacitor mismatch errors are digitally corrected with error coefficients stored in non-volatile memory. Dither is used to reduce the effect of errors in the flash ADC within the second ADC. The ADC was implemented on 0.25 m CMOS process with PIP capacitors and achieves a SNR of 93 dB with a 50 kHz input tone. INL and DNL are within LSB and LSB respectively. Power consumption is 105 mW, excluding LVDS interface power.

Published in:

Solid-State Circuits, IEEE Journal of  (Volume:45 ,  Issue: 12 )