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Compendium of Test Results of Recent Single Event Effect Tests Conducted by the Jet Propulsion Laboratory

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6 Author(s)
McClure, S.S. ; Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA ; Allen, G.R. ; Irom, F. ; Scheick, L.Z.
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This paper reports heavy ion and proton-induced single event effect (SEE) results from recent tests for a variety of microelectronic devices. The compendium covers devices tested over the last two years by the Jet Propulsion Laboratory.

Published in:
Radiation Effects Data Workshop (REDW), 2010 IEEE

Date of Conference: 20-23 July 2010

Page(s):
6
ISSN :
2154-0519
Print ISBN:
978-1-4244-8405-8
INSPEC Accession Number:
11646646
Conference Location :
Denver, CO
Digital Object Identifier :
10.1109/REDW.2010.5619495

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