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Reliability of modified designs: a Bayes analysis of an accelerated test of electronic assemblies

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1 Author(s)
Hart, Louis ; IBM, Research Triangle Park, NC, USA

Accelerated tests on two similar assemblies suggest that their lifetimes are in excess of 30000 h. A Bayes approach to reliability estimation using life test data from the two assemblies and those from an earlier evaluation of a third assembly, similar to the two under study, is described. The Bayes approach permitted a reduction in the number of test samples, compared to the earlier evaluation. The reliability of the two new assemblies was comparable to or better than that of the older one

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Reliability, IEEE Transactions on  (Volume:39 ,  Issue: 2 )