Scheduled System Maintenance:
Some services will be unavailable Sunday, March 29th through Monday, March 30th. We apologize for the inconvenience.
By Topic

System level self-healing for parametric yield and reliability improvement under power bound

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Narasimhan, S. ; Dept. of EECS, Case Western Reserve U., Cleveland, OH, USA ; Paul, S. ; Chakraborty, R.S. ; Wolff, F.
more authors

Post-silicon process compensation or “healing” of integrated circuits (ICs) has emerged as an effective approach to improve yield and reliability under parameter variations. In a System-on-Chip (SoC) comprising of multiple cores, different cores can experience different process shift due to local within-die variations. Furthermore, the cores are likely to have different sensitivities with respect to system power dissipation and system output parameters such as quality of service or throughput. Post-silicon healing has been addressed earlier at core level using various compensation approaches. In this paper, we present a system level healing algorithm for compensating SoC chips for a specific output parameter under power constraint. We formulate the healing problem as an ordinal optimization problem, where individual cores need to be assigned the right amount of healing that satisfies the target system performance and power requirement. Next, we propose an efficient solution to the problem using a priori design-time information about the relative sensitivities of the cores to system performance and power. Simulation results for example systems show that the proposed healing approach can achieve higher parametric yield and better settling time compared to conventional healing approaches.

Published in:

Adaptive Hardware and Systems (AHS), 2010 NASA/ESA Conference on

Date of Conference:

15-18 June 2010